RF Analysis System - RF System - Equipment

QRT RF Analysis System Q-LTS-RF

The RF Lifetime Test System supports RF-HTOL (High-Temperature Operating Life-test) and RF-ALT (Accelerated Life Test) tests to evaluate the lifetime of the RF Wireless Devices.
The System applies unique RF Stress conditions to all DUTs (Device Under Tests) and detects precise RF Parameter degradation from each DUT in real time. There is no need to configure complex
RF signals using expensive RF instruments to perform similar
RF lifetime testing.
All DUT can be thermally stressed without a huge temperature chamber, and each DUT can be tested simultaneously under various stress/test conditions. The System executes all test functions and manages all control functions autonomously in real time.
All System functions are remotely controllable, and the entire test procedures can be fully automated. The System comes with complete Lifetime Analysis Software for the lifetime and useful
life analysis from the data collected during the RF Lifetime Testing.

System Structure

Dynamic Acceleration System

RF Generation Unit(RGU) supplies RF Input Power per DUT

RF Detection Unit(RDU) monitors RF Output Power per DUT
Static Acceleration System

Static Acceleration Unit(SAU) supplies DC Power and controls Temperature per DUT
System operating SW

Adjustment of acceleration conditions for each DUT

RF Calibration

Real Time Monitoring

Lifetime Analysis SW

Data Classification

Optimal Distribution Function

Activation Energy

Estimated Lifetime

Main Application

Specification

Specification List	Unit	Q-LTS-RF	Remark
Supply Stress	-	RF , Temperature, Voltage, Current
RF frequency	GHz	0.6~6 27~32	Customization available
RGU Output Accuracy	dBm	Typ. +33
RGU Output Accuracy	dB	±0.5
RF Harmonic	dBc	Max. -25
RF Dynamic Range	dB	Min. 25
Monitoring Parameter	-	RF input & output Power, Temperature, Voltage, Current	per DUT Customization available
Detection Accuracy	dB	±0.3
Detecting Range (DUT Output)	dBm	Up to 43	per DUT
Simultaneous DUTs	EA.	40 Scalable	per System
Temperature Control Range Accuracy	°C	50~200 +/-2	Adjustable per DUT (Chamber Less)
Temperature Change Rate	°C/min	Min. 3
Voltage Control Range	V	Up to 28 Up to 50 Fixed -10	5 CHs per DUT
Supply Power	W	Typ. 100	per DUT
Lifetime Estimation Software	-	Automated Lifetime Estimation Software	Customization available
Lifetime Estimation Software	-	Data classification by degradation tendency, Data Server Interworking, Automatic collection of failure lifetime by setting degradation criterion, Optimal Distribution recommendation, Lifetime estimation, Activation energy, Acceleration Factor, Creating an Accelerated Model for Stress, Warranty lifetime, Automatic report generation.	Customization available