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Electrical Overstress (EOS) is a major cause of failure of semiconductors that can degrade performance or cause permanent failure due to excessive electrical stress (voltage, current, power, etc) exceeding the Specification Limit of semiconductors and circuits. To evaluate EOS tolerance, IEC61000-4-5 standard waveforms and DC Pulse can be applied to semiconductors and electronic components.

Semiconductor(Memory, System IC), Discrete IC, Passive Component Level EOS(Electrical Overstress) Test

The KT-200SG equipment can evaluate EOS tolerance by applying IEC61000-4-5 standard waveforms to semiconductors and electronic components, and 2651A (High Power Source Meter) can evaluate tolerance against electrical stress by applying current or voltage under desired conditions to simulate defects.