SEE Analysis System - SEE System - Equipment

QRT SEE Analysis System

The SEE Analysis System is highly portable and configurable system enabling users to test wide variety of devices at different radiation beam facilities. For example, the system can test DRAM, SRAM, flash or SSD devices at neutron, proton or heavy ion beams.
All test execution and control functions are running in real-time, are remotely controllable, and can be fully automated.
The System can use a pre-calibrated golden reference device and/or dosimetry board to achieve higher test accuracy and efficiency. With these unique features, users can save test time and use different beam facilities with ease.

System Structure

With its expandable main body and customizable functional modules, the SEE system provides a flexible and adaptable solution for evaluating a wide range of semiconductor products, including memory, system IC, power semiconductor, and SSD. To meet the diverse needs of its users, the system is constantly evolving through the development and updating of new function modules that support various semiconductor types and interfaces, enabling it to stay current with the latest technological advancements and customer requirements.

Chassis

Power control for each module

Simultaneous and Concurrent operation of multiple modules

Provide remote access and control functions
Functional Modules

Supply power to UUT

Generate and drive test algorithms to UUT

Monitor all test statuses and log test results in real-time
Dosimetry Board

Real-time acquisition of the beam’s status during test

Measured beam profile enables users to produce an accurate and effective soft error rate

Pre-calibrated single reference device provides in-situ monitoring capability
UUT board (Unit Under Test)

DUT’s are mounted on the UUT board for accelerated radiation test operation

Single or multiple UUTs can be tested concurrently at the same time

All DUTs are concurrently exercised
Control System

Remotely operated and controlled

Real-time data monitoring and logging

Allow monitoring of vital status and test progress

Main Functions

Evaluation for Certification: Soft Error Test Report

“Achieving Certification Goals with Our SEE Analysis System”: Ensure your semiconductors meet industry standards with our SEE Evaluation System. Designed to comply with JEDEC standards, our System includes standard-aware technology for full radiation test compliance. The System allows you to perform accurate and effective means to certify your device with ease. Trust in the quality and reliability of our System for a successful certification process.

Comparative Assessment: Assessment for Comparative Analysis

“Efficiently Identify the Best from the multiple Candidate Samples with Our System”: Streamline your soft error mitigation process and make informed decisions with the System. The solution allows you to easily compare and evaluate multiple samples; from your own, comparative, or referenced devices. Save time and resources with our efficient and effective assessment process, the assessment can be done with multiple different radiation beam sources.

Early Assessment & Validation: Pre-production Validation & Analysis

"Verify Your Pre-Production Device with Our System and Enjoy Successful Production”: Stay ahead of the curve and make actionable decisions with our System. Verify the product in advance while you are in development and ensure its readiness for production ramp. The System can provide information that can help improve the soft error rate. Get peace of mind with our advanced early assessment and validation solutions.

Tolerance & Criticality Validation: Tolerance and Limit Validation & Analysis

"Optimize Your Radiation Testing with Our System for Hidden Dangers": Get accurate and comprehensive results with our System. The solution allows you to control the critical SEE characteristics; such as SEL, SEBO energy and enables you to easily validate limits of the tolerance and critical condition of the radiation. Make informed decisions and improve your testing process with our advanced validation process. Further services from QRT are also available such as advanced SEBO FA and TPA-based SEE analysis.

Failure Duplication: Failure Duplication and Analysis

"Get to the Root Cause of RMA, NTF, and Burn-out Failures with QRT”: Data centers located at high altitudes are more susceptible to failures such as NFTs and CNDs, which are commonly caused by high-energy neutrons. Our System has a process to reproduce and analyze the root cause of these failures, allowing you to effectively diagnose and provide corrective actions to the NTF, SEFI, and SEL failures. These functions allow you to manage and mitigate RMAs from the field and keep customers happy.

Excellent Application Joint R&D Examples

At QRT, we use the state-of-the-art SEE Analysis System to establish the best practice standards for domestic accelerator facilities. Our joint R&D program with LANL/TRIUMF and other overseas accelerator facilities allowed us to earn recognition as a provider of the best practice standard equipment. We are constantly pushing the boundaries of radiation testing technologies and are actively working towards establishing recognized de-facto standards for all radiation test facilities.

KIRAMS MC-50 neutron standard DB