Test Analysis & Equipment Utilization

Materials Analysis Service

We are providing solution to analyze the construction of devices used in semiconductors, polymers, electronic components, and other products by utilizing various analysis systems and latest analysis tools. We are also providing one-stop comprehensive analysis services as well as our unique sample preconditioning services.
  • Analyze the micro construction of materials and machine micro domain.
  • Analyze the components of surface materials and measure distribution and component distribution by depth
  • Qualitative and quantitative analysis of inorganic compounds
  • Qualitative and quantitative analysis of organic compounds

Material Analysis

Micro Structure Analysis
  • FE-SEM Analysis
  • Dual FIB Analysis
  • TEM Analysis
  • EDS Analysis
  • EELS Analysis
Surface Analysis
  • AFM Analysis
  • TOF-SIMS Analysis
  • AES Analysis
  • XRD Analysis
  • XPS Analysis
Organic Analysis
  • GC Analysis
  • GC-MS Analysis
  • FT-IR Analysis
  • UV/VIS Analysis
Inorganic Analysis
  • ICP-OES Analysis
  • ICP-MS Analysis
  • XRF Analysis
  • IC Analysis

Cases of Material Analysis

LED Quantum Well Structure _ TEM
LED Quantum Well Structure_TEM
LED Quantum Well Structure _ TEM
Nano Cellulose_FE-SEM
LED Quantum Well Structure _ TEM
Cathode active materials for secondary cells _FE-SEM
LED Quantum Well Structure _ TEM
Bump Grain Orientation_Dual FIB
Semiconductor Active & STI Surface Active Component Distribution _ TEM & EELS Mapping

Semiconductor Active & STI Surface Active Component Distribution _ TEM & EELS Mapping

Poly Grain _ AFM

Poly Grain _ AFM

Component analysis of Al Pad contaminants _ AES

Component analysis of Al Pad contaminants _ AES Component analysis of Al Pad contaminants _ AES

MOSFET Back Metal Component Analysis _ XPS

MOSFET Back Metal Component Analysis _ XPS

Analysis of Poly Crystal Structure _ XRD

Analysis of Poly Crystal Structure _ XRD